Fluke Corporation MET/CAL Procedure ============================================================================= INSTRUMENT: Keithley 199: (1 year) CAL VER IEEE /5720 DATE: 15-Feb-95 AUTHOR: Fluke Corporation REVISION: $Revision: 1.1 $ ADJUSTMENT THRESHOLD: 70% NUMBER OF TESTS: 45 NUMBER OF LINES: 319 CONFIGURATION: Fluke 5720A ============================================================================= # # Source: # Keithley Model 199 DMM Instruction Manual, January 1988 # # Compatibility: # MET/CAL 4.2 or later # # Subprocedures: # None # # Required Files: # None # # System Specifications: # TUR calculation is based on specification interval of the accuracy file. # The default 5720A accuracy file contains 90 day specs. # # Fluke makes no warranty, expressed or implied, as to the fitness # or suitability of this procedure in the customer's application. # # The 90 day specifications of the 5720A are used in TUR computations. # # AC Current Verification # 30mA Range (29mA @ 10kHz), TUR = 1.189 # 3A Range (2A @ 10kHz), TUR = 0.714 # STEP FSC RANGE NOMINAL TOLERANCE MOD1 MOD2 3 4 CON 1.001 M5720 C2 1.002 ASK- R Q N P F W 1.003 HEAD PRELIMINARY INSTRUCTIONS 1.004 DISP Allow the Keithley 199 to stabilize in an environment 1.004 DISP with ambient temperature of 18 to 28C and relative 1.004 DISP humidity of less than 80%. 1.004 DISP Then turn the Keithley 199 on, and allow it to warm up 1.004 DISP for at least 2 hours. 1.004 DISP Connect the UUT to IEEE Port 1. 1.005 DISP *************************************************** 1.005 DISP To reduce noise pickup by test leads, particularly 1.005 DISP during high Ohms verification, use shielded test 1.005 DISP cables between the Fluke 5720A and the UUT. 1.005 DISP Twist the cables to minimize HF signal pickup. 1.005 DISP *************************************************** 1.006 DISP Connect the 5720A and the UUT as follows. 1.006 DISP [32] 5720A OUTPUT HI to UUT VOLTS/OHMS INPUT HI 1.006 DISP [32] 5720A OUTPUT LO to UUT VOLTS/OHMS INPUT LO 1.006 DISP [32] 5720A SENSE HI to UUT OHMS SENSE HI 1.006 DISP [32] 5720A SENSE LO to UUT OHMS SENSE LO 1.006 DISP [32] 5720A AUX CURRENT OUTPUT HI to UUT AMPS INPUT 1.007 IEEE [SDC] 1.008 IEEE U5X[I] 1.009 MATH MEM1 = MEM 1.010 JMPZ 1.013 1.011 DISP Place the FRONT/REAR switch to the FRONT setting (out 1.011 DISP position). 1.012 JMP 1.008 1.013 HEAD {DC VOLTS TESTS} 1.014 HEAD DC VOLTS TESTS: {300mV Range} 1.015 IEEE T4F0R1X 1.016 5720 300mV S 2W 1.017 IEEE [I][I] 1.018 MATH MEM = MEM * 1000 1.019 MEME 1.020 MEMC 300 mV 0.039U 2.001 5720 -300mV S 2W 2.002 IEEE [I][I] 2.003 MATH MEM = MEM * 1000 2.004 MEME 2.005 MEMC 300 mV 0.039U 3.001 HEAD DC VOLTS TESTS: {3V Range} 3.002 IEEE F0R2X 3.003 5720 3V S 2W 3.004 IEEE [I][I] 3.005 MEME 3.006 MEMC 3 V 0.00023U 4.001 5720 -3V S 2W 4.002 IEEE [I][I] 4.003 MEME 4.004 MEMC 3 V 0.00023U 5.001 HEAD DC VOLTS TESTS: {30V Range} 5.002 IEEE F0R3X 5.003 5720 30V S 2W 5.004 IEEE [I][I] 5.005 MEME 5.006 MEMC 30 V 0.003U 6.001 5720 -30V S 2W 6.002 IEEE [I][I] 6.003 MEME 6.004 MEMC 30 V 0.003U 7.001 HEAD DC VOLTS TESTS: {300V Range} 7.002 IEEE F0R4X 7.003 5720 300V S 2W 7.004 IEEE [I][I] 7.005 MEME 7.006 MEMC 300 V 0.03U 8.001 5720 -300V S 2W 8.002 IEEE [I][I] 8.003 MEME 8.004 MEMC 300 V 0.03U 9.001 5720 * S 9.002 HEAD {AC VOLTS TESTS} 9.003 HEAD AC VOLTS TESTS: {300mV Range} 9.004 IEEE F1R1X 9.005 5720 290mV 20H S 2W 9.006 IEEE [I][I] 9.007 MATH MEM = MEM * 1000 9.008 MEME 9.009 MEMC 300 mV 5.9U 20H 10.001 5720 290.000mV 50H S 2W 10.002 IEEE [I][I] 10.003 MATH MEM = MEM * 1000 10.004 MEME 10.005 MEMC 300 mV 1.115U 50H 11.001 5720 290mV 200H S 2W 11.002 IEEE [I][I] 11.003 MATH MEM = MEM * 1000 11.004 MEME 11.005 MEMC 300 mV 0.635U 200H 12.001 5720 290mV 10kH S 2W 12.002 IEEE [I][I] 12.003 MATH MEM = MEM * 1000 12.004 MEME 12.005 MEMC 300 mV 0.635U 10kH 13.001 5720 290mV 100kH S 2W 13.002 IEEE [I][I] 13.003 MATH MEM = MEM * 1000 13.004 MEME 13.005 MEMC 300 mV 6.1U 100kH 14.001 HEAD AC VOLTS TESTS: {3V Range} 14.002 IEEE F1R2X 14.003 5720 2.9V 20H S 2W 14.004 IEEE [I][I] 14.005 MEME 14.006 MEMC 3 V 0.059U 20H 15.001 5720 2.9V 50H S 2W 15.002 IEEE [I][I] 15.003 MEME 15.004 MEMC 3 V 0.01115U 50H 16.001 5720 2.9V 200H S 2W 16.002 IEEE [I][I] 16.003 MEME 16.004 MEMC 3 V 0.00635U 200H 17.001 5720 2.9V 10kH S 2W 17.002 IEEE [I][I] 17.003 MEME 17.004 MEMC 3 V 0.00635U 10kH 18.001 5720 2.9V 100kH S 2W 18.002 IEEE [I][I] 18.003 MEME 18.004 MEMC 3 V 0.0465U 100kH 19.001 HEAD AC VOLTS TESTS: {30V Range} 19.002 IEEE F1R3X 19.003 5720 29V 20H S 2W 19.004 IEEE [I][I] 19.005 MEME 19.006 MEMC 30 V 0.59U 20H 20.001 5720 29V 50H S 2W 20.002 IEEE [I][I] 20.003 MEME 20.004 MEMC 30 V 0.1115U 50H 21.001 5720 29V 200H S 2W 21.002 IEEE [I][I] 21.003 MEME 21.004 MEMC 30 V 0.0635U 200H 22.001 5720 29V 10kH S 2W 22.002 IEEE [I][I] 22.003 MEME 22.004 MEMC 30 V 0.0635U 10kH 23.001 5720 29V 100kH S 2W 23.002 IEEE [I][I] 23.003 MEME 23.004 MEMC 30 V 0.465U 100kH 24.001 HEAD AC VOLTS TESTS: {300V Range} 24.002 IEEE F1R4X 24.003 5720 200V 20H S 2W 24.004 IEEE [I][I] 24.005 MEME 24.006 MEMC 300 V 4.1U 20H 25.001 5720 290V 50H S 2W 25.002 IEEE [I][I] 25.003 MEME 25.004 MEMC 300 V 1.115U 50H 26.001 5720 290V 200H S 2W 26.002 IEEE [I][I] 26.003 MEME 26.004 MEMC 300 V 0.635U 200H 27.001 5720 200V 10kH S 2W 27.002 IEEE [I][I] 27.003 MEME 27.004 MEMC 300 V 0.5U 10kH 28.001 5720 * S 28.002 HEAD {RESISTANCE TESTS} 28.003 HEAD RESISTANCE TESTS: {300 Ohm Range} 28.004 IEEE F2R1X 28.005 5720 190Z S 4W 28.006 IEEE [I][I] 28.007 MEME 28.008 MEMC 300 Z 0.027U 29.001 HEAD RESISTANCE TESTS: {3 kOhm Range} 29.002 IEEE F2R2X 29.003 5720 1.9kZ S 4W 29.004 IEEE [I][I] 29.005 MATH MEM = MEM / 1000 29.006 MEME 29.007 MEMC 3 kZ 0.0002U 30.001 HEAD RESISTANCE TESTS: {30 kOhm Range} 30.002 IEEE F2R3X 30.003 5720 19kZ S 4W 30.004 IEEE [I][I] 30.005 MATH MEM = MEM / 1000 30.006 MEME 30.007 MEMC 30 kZ 0.002U 31.001 HEAD RESISTANCE TESTS: {300 kOhm Range} 31.002 IEEE F2R4X 31.003 5720 190kZ S 2W 31.004 IEEE [I][I] 31.005 MATH MEM = MEM / 1000 31.006 MEME 31.007 MEMC 300 kZ 0.052U 32.001 HEAD RESISTANCE TESTS: {3 MOhm Range} 32.002 IEEE F2R5X 32.003 5720 1.9MZ S 2W 32.004 IEEE [I][I] 32.005 MATH MEM = MEM / 1000000 32.006 MEME 32.007 MEMC 3 MZ 0.0006U 33.001 HEAD RESISTANCE TESTS: {30 MOhm Range} 33.002 IEEE F2R6X 33.003 5720 19MZ S 2W 33.004 IEEE [I][I] 33.005 MATH MEM = MEM / 1000000 33.006 MEME 33.007 MEMC 30 MZ 0.0233U 34.001 HEAD RESISTANCE TESTS: {300 MOhm Range} 34.002 IEEE F2R7X 34.003 5720 100MZ S 2W 34.004 IEEE [I][I] 34.005 MATH MEM = MEM / 1000000 34.006 MEME 34.007 MEMC 300 MZ 2.005U 35.001 HEAD {DC CURRENT TESTS} 35.002 HEAD DC CURRENT TESTS: {30mA Range} 35.003 IEEE F3R1X 35.004 5720 30mA S 2W 35.005 IEEE [I][I] 35.006 MATH MEM = MEM * 1000 35.007 MEME 35.008 MEMC 30 mA 0.0165U 36.001 HEAD DC CURRENT TESTS: {3A Range} 36.002 IEEE F3R2X 36.003 5720 2A S 2W 36.004 IEEE [I][I] 36.005 MEME 36.006 MEMC 3 A 0.1% 1.5e-4U 37.001 HEAD {AC CURRENT TESTS} 37.002 HEAD AC CURRENT TESTS: {30mA Range} 37.003 IEEE F4R1X 37.004 5720 29mA 20H S 2W 37.005 IEEE [I][I] 37.006 MATH MEM = MEM * 1000 37.007 MEME 37.008 MEMC 30 mA 0.59U 20H 38.001 5720 29mA 45H S 2W 38.002 IEEE [I][I] 38.003 MATH MEM = MEM * 1000 38.004 MEME 38.005 MEMC 30 mA 0.184U 45H # Note, published verification point is 29mA @ 10kHz. # Verify @ 1kHz with > 4:1 TUR. # Functional check only at 10kHz. 39.001 5720 29mA 1kH S 2W 39.002 IEEE [I][I] 39.003 MATH MEM = MEM * 1000 39.004 MEME 39.005 MEMC 30 mA 0.6% 1e-5U 1kH 40.001 ASK- U 40.002 5720 29mA 10kH S 2W 40.003 IEEE [I][I] 40.004 MATH MEM = MEM * 1000 40.005 MEME 40.006 MEMC 30 mA 0.6% 1e-5U 10kH 41.001 ASK+ U 41.002 HEAD AC CURRENT TESTS: {3A Range} 41.003 IEEE F4R2X 41.004 5720 2A 40H S 2W 41.005 IEEE [I][I] 41.006 MEME 41.007 MEMC 3 A 2% 0.001U 40H 42.001 5720 2A 45H S 2W 42.002 IEEE [I][I] 42.003 MEME 42.004 MEMC 3 A 0.6% 0.001U 45H # Note, published verification point is 2A @ 10kHz. # Verify @ 5kHz with > 4:1 TUR. # Functional check only at 10kHz. 43.001 5720 2A 5kH S 2W 43.002 IEEE [I][I] 43.003 MEME 43.004 MEMC 3 A 0.6% 0.001U 5kH 44.001 ASK- U 44.002 5720 2A 10kH S 2W 44.003 IEEE [I][I] 44.004 MEME 44.005 MEMC 3 A 0.6% 0.001U 10kH 45.001 5720 * S 45.002 IEEE [SDC] 45.003 END